Enabling javascript will improve the functionality of this page. skip to content
Lehman College

Catalog search

Catalog links

print page

GEP 3060: Raster Applications.

4 hours (2 lecture, 2 lab), 3 credits. Raster based operations including the creation, modification, analysis and integration with vector data, using a Geographic Information System (GIS). Topics include surface analysis, multi-criteria/multi-objective evaluation, and map algebra. PREREQ: GEP 205 or instructor's permission.

Last modified: 7/30/2015